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Business Process Scenario

General description of the process and high-level e-business process flow.


Introduction

During the Semiconductor process electrical test data is acquired at different points. This data is used by design, development and test engineers to verify products meet design specifications and to further improve product designs or increase yield (the % of fully functional chips on a wafer).

High-Level Process Flow





Figure 1.   The flow above shows the complexity of the overall fabrication process and provides an overview of necessary data capture components.   Data for logistics, inline metrology and test are captured at multiple points of the fabrication process.  The complex fabrication process requires accurate disposition of data which is required for foundry partners to understand and react to design issues.

In the foundry business model, which this proposal specifically addresses, fabless semiconductor companies (FSC) rely on the manufacturing fabs to transmit in line test, wafer test and module test data to the FSC for subsequent use by the FSC engineering teams.   The data is stored by the FSC in their own databases so that engineers may perform advanced statistical analysis as required by business needs.  Increasingly FCS are using this data to compare yields and processes for like products manufactured by different foundry partners.  

At present there are no industry wide standards as to how this data is formatted for transmission to customers or business partners.

Key Points 

Data is sent from foundry to the FSC (or business partner).

Data is sent on a lot by lot basis.   One lot being a fixed number of semiconductor wafers (usually 25) that is processed as a unit.

Data is sent as soon as it can be reconciled with logistics and the data integrity is verified.

The frequency of the transfer of information is dependant on the number of lots the FCS has ordered from the foundry and the manufacturing schedule.

 


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